Surface Photovoltage Analysis of Photoactive Materials
Editorial: WORLD SCIENTIFIC
Isbn : 9781786347657
Pasta : Dura
Item #: 1967
SPV measurements with Kelvin probes, fixed capacitors, electron beams and photoelectrons are explained. Details are given for continuous, modulated and transient SPV spectroscopy. Simulation principles of SPV signals by random walks are introduced and applied for small systems. Application examples are selected for the characterization of silicon surfaces, gallium arsenide layers, electronic states in colloidal quantum dots, transport phenomena in metal oxides and local charge separation across photocatalytic active crystallites.